| Morphology and growth kinetics of organic thin films deposited by hot wall epitaxy on KCl substrates A Andreev, T Haber, DM Smilgies, R Resel, H Sitter, NS Sariciftci, L Valek Journal of Crystal Growth 275 (1), e2037-e2042, 2005 | 24 | 2005 |
| Defect engineering during Czochralski crystal growth and silicon wafer manufacturing L Válek, J Šik Modern Aspects of Bulk Crystal and Thin Film Preparation, 34-71, 2012 | 20 | 2012 |
| OISF pattern and grown-in precipitates in heavily boron doped silicon L Válek, D Lysáček, J Šik Journal of The Electrochemical Society 154 (10), H904, 2007 | 14 | 2007 |
| Method of forming a gettering structure having reduced warpage and gettering a semiconductor wafer therewith D Lysacek, J Vojtechovska, L Dornak, P Kostelnik, L Valek, P Panek US Patent 8,846,500, 2014 | 10 | 2014 |
| Highly aligned organic semiconductor thin films grown by hot wall epitaxy A Andreev, H Sitter, R Resel, DM Smilgies, H Hoppe, G Matt, NS Sariciftci, ... Molecular Crystals and Liquid Crystals 385 (1), 61-70, 2002 | 10 | 2002 |
| Multilayer gettering structure for semiconductor device and method D Lysacek, M Lorenc, L Valek US Patent 7,737,004, 2010 | 8 | 2010 |
| Thermal stability of undoped polycrystalline silicon layers on antimony and boron-doped substrates D Lysáček, L Válek, J Spousta, T Šikola, R Špetík Thin Solid Films 518 (14), 4052-4057, 2010 | 7 | 2010 |
| Limits of the copper decoration technique for delineating of the V–I boundary L Válek, Š Stehlík, J Orava, M Ďurík, J Šik, T Wágner Journal of physics and chemistry of solids 68 (5-6), 1157-1160, 2007 | 7 | 2007 |
| Semiconductor devices and methods of making the same J Sik, P Kostelník, L Válek, M Lorenc, M Pospìsil, D Lysácek, JM Parsey Jr US Patent App. 14/200,283, 2014 | 6 | 2014 |
| Enhanced Oxygen Precipitation during the Czochralski Crystal Growth L Válek, J Šik, D Lysáček Solid State Phenomena 131, 167-174, 2008 | 3 | 2008 |
| Technologie růstu monokrystalů křemíku Czochralskiho metodou M Lorenc, J Šik, L Válek FYZIKÁLNÍ PRINCIPY TECHNOLOGIE VÝROBY POLOVODIČŮ, 15, 0 | 3 | |
| Structural changes of polycrystalline silicon layers during high temperature annealing D Lysáček, L Válek On Semiconductor Czech Republic, 0 | 2 | |
| Semiconductor devices and methods of making the same P Kostelnik, M Lorenc, D Lysá, JM Parsey Jr US Patent 9,355,965, 2016 | 1 | 2016 |
| Methods of laser marking semiconductor substrates P Kostelník, M Lorenc, D Lysá, JM Parsey Jr US Patent 9,099,481, 2015 | 1 | 2015 |
| Růstové defekty v monokrystalech Czochralskiho křemíku L VÁLEK Rožnov pod Radhoštěm, 2009 | 1 | 2009 |
| Comparison of gettering capability of various extrinsic techniques and enhancement of gettering ability of polycrystalline silicon layers D Lysácek, M Lorenc, L Válek Poster at Joint Fith International Conference on Solid State Crystals and …, 2007 | 1 | 2007 |
| THERMAL STABILITY OF UNDOPED POLYSILICON LAYERS D Lysáček, L Válek | 1 | |
| Riddle and Bond Silicon on Insulator (RABSOI) R Spetik, F Kudrna, L Valek 2017 29th International Symposium on Power Semiconductor Devices and IC's …, 2017 | | 2017 |
| Advanced Silicon Wafer Manufacturing for Sub-Micron Technologies M Lorenc, M Pospíšil, L Válek, V Englišová, J Šik | | |
| Silicon wafer gettering ability M Durik, L Valek, M Lorenc | | |
Michal LorencON SEMICONDUCTORVerified email at onsemi.com
