| Advancing MIM electronics: Amorphous metal electrodes EW Cowell III, N Alimardani, CC Knutson, JF Conley Jr, DA Keszler, ... Advanced Materials(FRG) 23 (1), 74-78, 2011 | 170 | 2011 |
| Investigation of the impact of insulator material on the performance of dissimilar electrode metal-insulator-metal diodes Nasir Alimardani, Sean W. King, Benjamin L. French, Cheng Tan, Benjamin P ... Journal of Applied Physics 116 (024508), 024508-1, 2014 | 97 | 2014 |
| Step tunneling enhanced asymmetry in asymmetric electrode metal-insulator-insulator-metal tunnel diodes N Alimardani, JF Conley Applied Physics Letters 102 (14), 2013 | 94 | 2013 |
| Impact of electrode roughness on metal-insulator-metal tunnel diodes with atomic layer deposited Al2O3 tunnel barriers N Alimardani, E William Cowell, JF Wager, JF Conley, DR Evans, M Chin, ... Journal of Vacuum Science & Technology A 30 (1), 2012 | 91 | 2012 |
| Enhancing metal-insulator-insulator-metal tunnel diodes via defect enhanced direct tunneling N Alimardani, JF Conley Applied Physics Letters 105 (8), 2014 | 68 | 2014 |
| Conduction processes in metal-insulator-metal diodes with Ta2O5 and Nb2O5 insulators deposited by atomic layer deposition N. Alimardani, J.M. McGlone, J.F. Wager, J.F Journal of Vacuum Science & Technology A 32 (1), 01A122-1, 2013 | 55* | 2013 |
| Investigation of metal-insulator-metal (MIM) and nanolaminate barrier MIIM tunnel devices fabricated via atomic layer deposition N Alimardani | 11 | 2013 |
| Impact of Electrode Roughness on Metal-Insulator-Metal (MIM) Diodes and Step Tunneling in Nanolaminate Tunnel Barrier Metal-Insulator-Insulator-Metal (MIIM) Diodes JF Conley Jr, N Alimardani Rectenna Solar Cells, 111-134, 2013 | 7 | 2013 |
| Step tunneling enhanced asymmetry in metal-insulator-insulator-metal (MIIM) diodes for rectenna applications N Alimardani, JF Conley Jr Next Generation (Nano) Photonic and Cell Technologies for Solar Energy …, 2013 | 5 | 2013 |
| Stability and bias stressing of metal/insulator/metal diodes N Alimardani, JF Conley, EW Cowell, JF Wager, M Chin, S Kilpatrick, ... 2010 IEEE International Integrated Reliability Workshop Final Report, 80-84, 2010 | 3 | 2010 |
| Conduction processes in metal–insulator–metal diodes with Ta₂O₅ and Nb₂O₅ insulators deposited by atomic layer deposition N Alimardani, JM McGlone, JF Wager, JF Conley Jr Journal of Vacuum Science & Technology A 32 (1), 2013 | 1 | 2013 |
| Electrical stressing of bilayer insulator HfO2/Al2O3 metal-insulator-insulator-metal (MIIM) diodes T Klarr, DZ Austin, N Alimardani, JF Conley 2013 IEEE International Integrated Reliability Workshop Final Report, 15-18, 2013 | 1 | 2013 |
| Conduction processes in metal–insulator–metal diodes with Ta {sub 2} O {sub 5} and Nb {sub 2} O {sub 5} insulators deposited by atomic layer deposition N Alimardani, JM McGlone, JF Wager Journal of Vacuum Science and Technology. A, Vacuum, Surfaces and Films 32 (1), 2014 | | 2014 |
| Investigation of the impact of insulator material on dissimilar electrode metal-insulator-metal diodes N Alimardani, SW King, BL French, C Tan, BP Lampert, JF Conley Jr | | |
| PLATFORM TECHNICAL PRESENTATIONS Session P Lenahan, R Schrimpf, C Mouli, A Calderoni, E Ogawa, E Wu, J Su, ... | | |
