Alexei Gruverman
Alexei Gruverman
Charles Bessey Professor of Physics, University of Nebraska
Verified email at unl.edu
TitleCited byYear
Giant switchable photovoltaic effect in organometal trihalide perovskite devices
Z Xiao, Y Yuan, Y Shao, Q Wang, Q Dong, C Bi, P Sharma, A Gruverman, ...
Nature materials 14 (2), 193, 2015
8562015
Imaging and control of domain structures in ferroelectric thin films via scanning force microscopy
A Gruverman, O Auciello, H Tokumoto
Annual review of materials science 28 (1), 101-123, 1998
5221998
Efficiency enhancement in organic solar cells with ferroelectric polymers
Y Yuan, TJ Reece, P Sharma, S Poddar, S Ducharme, A Gruverman, ...
Nature materials 10 (4), 296, 2011
4512011
Nanoscale ferroelectrics: processing, characterization and future trends
A Gruverman, A Kholkin
Reports on Progress in Physics 69 (8), 2443, 2005
4232005
Tunneling electroresistance effect in ferroelectric tunnel junctions at the nanoscale
A Gruverman, D Wu, H Lu, Y Wang, HW Jang, CM Folkman, ...
Nano letters 9 (10), 3539-3543, 2009
4092009
Mechanical writing of ferroelectric polarization
H Lu, CW Bark, DE De Los Ojos, J Alcala, CB Eom, G Catalan, ...
Science 336 (6077), 59-61, 2012
3942012
Scanning probe microscopy: electrical and electromechanical phenomena at the nanoscale
SV Kalinin, A Gruverman
Springer Science & Business Media, 2007
3482007
Grain boundary dominated ion migration in polycrystalline organic–inorganic halide perovskite films
Y Shao, Y Fang, T Li, Q Wang, Q Dong, Y Deng, Y Yuan, H Wei, M Wang, ...
Energy & Environmental Science 9 (5), 1752-1759, 2016
3392016
Nanoscale investigation of fatigue effects in Pb(Zr,Ti)O3 films
A Gruverman, O Auciello, H Tokumoto
Applied Physics Letters 69 (21), 3191-3193, 1996
2911996
Nanoscale characterisation of ferroelectric materials: scanning probe microscopy approach
M Alexe, A Gruverman
Springer Science & Business Media, 2013
2862013
Piezoresponse force microscopy and recent advances in nanoscale studies of ferroelectrics
A Gruverman, SV Kalinin
Journal of materials science 41 (1), 107-116, 2006
2842006
Scanning force microscopy for the study of domain structure in ferroelectric thin films
A Gruverman, O Auciello, H Tokumoto
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1996
2431996
Enhanced tunnelling electroresistance effect due to a ferroelectrically induced phase transition at a magnetic complex oxide interface
YW Yin, JD Burton, YM Kim, AY Borisevich, SJ Pennycook, SM Yang, ...
Nature materials 12 (5), 397, 2013
2422013
Nanoscale visualization and control of ferroelectric domains by atomic force microscopy
O Kolosov, A Gruverman, J Hatano, K Takahashi, H Tokumoto
Physical review letters 74 (21), 4309, 1995
2321995
Nanoscale imaging of domain dynamics and retention in ferroelectric thin films
A Gruverman, H Tokumoto, AS Prakash, S Aggarwal, B Yang, M Wuttig, ...
Applied physics letters 71 (24), 3492-3494, 1997
2261997
Thin Insulating Tunneling Contacts for Efficient and Water‐Resistant Perovskite Solar Cells
Q Wang, Q Dong, T Li, A Gruverman, J Huang
Advanced Materials 28 (31), 6734-6739, 2016
2232016
Direct studies of domain switching dynamics in thin film ferroelectric capacitors
A Gruverman, BJ Rodriguez, C Dehoff, JD Waldrep, AI Kingon, ...
Applied Physics Letters 87 (8), 082902, 2005
2182005
Mechanical stress effect on imprint behavior of integrated ferroelectric capacitors
A Gruverman, BJ Rodriguez, AI Kingon, RJ Nemanich, AK Tagantsev, ...
Applied Physics Letters 83 (4), 728-730, 2003
2182003
Vector piezoresponse force microscopy
SV Kalinin, BJ Rodriguez, S Jesse, J Shin, AP Baddorf, P Gupta, H Jain, ...
Microscopy and Microanalysis 12 (3), 206-220, 2006
2042006
Domain growth kinetics in lithium niobate single crystals studied by piezoresponse force microscopy
BJ Rodriguez, RJ Nemanich, A Kingon, A Gruverman, SV Kalinin, ...
Applied Physics Letters 86 (1), 012906, 2005
1932005
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Articles 1–20