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Co-authors
Yan ZhouThe Chinese University of Hong Kong (shenzhen)Verified email at cuhk.edu.cn
Motohiko EzawaUniversity of TokyoVerified email at ap.t.u-tokyo.ac.jp
Weisheng ZhaoFert Beijing Institute, Beihang UniversityVerified email at buaa.edu.cn
Xiaoxi LiuProfessor, Faculty of Engineering, Shinshu UniversityVerified email at cs.shinshu-u.ac.jp
Jing XIAThe Chinese University of Hong Kong, ShenzhenVerified email at link.cuhk.edu.cn
Wang KangBeihang UniversityVerified email at buaa.edu.cn
Na Lei (雷娜)北航自旋电子中心Verified email at buaa.edu.cn
Kang L. WangElectrical Engineering DepartmentVerified email at ee.ucla.edu
Laichuan ShenThe Chinese University of Hong Kong, ShenzhenVerified email at link.cuhk.edu.cn
Jiang WanjunDepartment of Physics, Tsinghua UniversityVerified email at tsinghua.edu.cn
Oleg A. TretiakovUniversity of New South WalesVerified email at unsw.edu.au
Guoqiang YuInstitute of Physics Chinese Academy of Sciences, UCLAVerified email at iphy.ac.cn
Raabe JoergGroup Leader, Paul Scherrer InstitutVerified email at psi.ch
Daoqian ZhuBeihang UniversityVerified email at buaa.edu.cn
Suzanne G.E. te VelthuisArgonne National LaboratoryVerified email at anl.gov
Axel HoffmannProfessor of Materials Science and Engineering, University of Illinois at Urbana-ChampaignVerified email at illinois.edu
M. Benjamin JungfleischDepartment of Physics and Astronomy, University of DelawareVerified email at udel.edu
John PearsonArgonne National LaboratoryVerified email at anl.gov
Olle HeinonenArgonne National LaboratoryVerified email at anl.gov
Byoung-Chul MinKorea Institute of Science and Technology (KIST)Verified email at kist.re.kr
Xichao Zhang
Verified email at shinshu-u.ac.jp - Homepage