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Varvara Brackmann
Varvara Brackmann
Group Leader at Fraunhofer IPMS-CNT
Verified email at ipms.fraunhofer.de
Title
Cited by
Cited by
Year
Elastic softening of β-type Ti–Nb alloys by indium (In) additions
M Calin, A Helth, JJG Moreno, M Bönisch, V Brackmann, L Giebeler, ...
Journal of the mechanical behavior of biomedical materials 39, 162-174, 2014
952014
Cu(In,Ga)Se2 superstrate solar cells: prospects and limitations
MD Heinemann, V Efimova, R Klenk, B Hoepfner, M Wollgarten, T Unold, ...
Progress in Photovoltaics: Research and Applications 23 (10), 1228-1237, 2015
652015
Enhanced performance of ultra-thin Cu (In, Ga) Se2 solar cells deposited at low process temperature
G Yin, V Brackmann, V Hoffmann, M Schmid
Solar Energy Materials and Solar Cells 132, 142-147, 2015
492015
Glow discharge optical emission spectrometry for quantitative depth profiling of CIGS thin-films
T Kodalle, D Greiner, V Brackmann, K Prietzel, A Scheu, T Bertram, ...
Journal of Analytical Atomic Spectrometry 34 (6), 1233-1241, 2019
422019
A fully integrated ferroelectric thin‐film‐transistor–influence of device scaling on threshold voltage compensation in displays
D Lehninger, M Ellinger, T Ali, S Li, K Mertens, M Lederer, R Olivio, ...
Advanced Electronic Materials 7 (6), 2100082, 2021
352021
Glow discharge plasma as a surface preparation tool for microstructure investigations
V Brackmann, V Hoffmann, A Kauffmann, A Helth, J Thomas, H Wendrock, ...
Materials characterization 91, 76-88, 2014
272014
Electrical properties of the µs pulsed glow discharge in a Grimm-type source: comparison of dc and rf modes
V Efimova, V Hoffmann, J Eckert
Journal of Analytical Atomic Spectrometry 26 (4), 784-791, 2011
262011
Sputter crater formation in the case of microsecond pulsed glow discharge in a Grimm-type source. Comparison of direct current and radio frequency modes
V Efimova, V Hoffmann, J Eckert
Spectrochimica Acta Part B: Atomic Spectroscopy 76, 181-189, 2012
222012
Combined hollow cathode vs. Grimm cell: semiconductive and nonconductive samples
A Gubal, A Ganeev, V Hoffmann, M Voronov, V Brackmann, S Oswald
Journal of Analytical Atomic Spectrometry 32 (2), 354-366, 2017
212017
Study in analytical glow discharge spectrometry and its application in materials science
V Efimova
152011
Examination of growth kinetics of copper rich Cu (In, Ga) Se2-films using synchrotron energy dispersive X-ray diffractometry
T Rissom, R Mainz, CA Kaufmann, R Caballero, V Efimova, V Hoffmann, ...
Solar energy materials and solar cells 95 (1), 250-253, 2011
152011
Elemental distribution profiling of thin films for solar cells
V Hoffmann, D Klemm, V Efimova, C Venzago, AA Rockett, T Wirth, ...
Advanced Characterization Techniques for Thin Film Solar Cells, 411-448, 2011
82011
The role of the spray pyrolysed Al2O3 barrier layer in achieving high efficiency solar cells on flexible steel substrates
SE Gledhill, A Zykov, T Rissom, R Caballero, CA Kaufmann, CH Fischer, ...
Applied Physics A 104, 407-413, 2011
72011
SEM image denoising and contour image estimation using deep learning
N Chaudhary, SA Savari, V Brackmann, M Friedrich
2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC …, 2020
22020
Influence of the dose assignment and fracturing type on patterns exposed by a variable shaped e-beam writer: simulation vs experiment
V Brackmann, M Friedrich, C Browning, N Hanisch, B Uhlig
35th European Mask and Lithography Conference (EMLC 2019) 11177, 159-168, 2019
12019
Model-Based XPS Technique for Characterization of Surface Composition on Nano-Scale SiCOH Sidewalls
A Vatsal, M Rudolph, S Oehler, V Brackmann, JW Bartha
ECS Journal of Solid State Science and Technology 12 (12), 124001, 2023
2023
Fabrication of gate electrodes for scalable quantum computing using CMOS industry compatible e-beam lithography and numerical simulation of the resulting quantum device
Proceedings Volume 12802, 38th European Mask and Lithography Conference …, 2023
2023
Feasibility of Wafer Exchange for European Edge AI Pilot Lines
V Brackmann, B Lilienthal-Uhlig, M Jaysnkar, S Beckx, I Madarevic, ...
Industrial Artificial Intelligence Technologies and Applications, 103, 2023
2023
Novel XPS Technique for Fluorocarbon Layer Evaluation on Nano-Scale Sicoh Sidewalls
A Vatsal, S Oehler, M Rudolph, V Brackmann, J Bartha
Electrochemical Society Meeting Abstracts 240, 923-923, 2021
2021
Investigation of Fluoro-Carbon Layer on Dense Sicoh Formed during CF4 and CF4/C4F6 Based Continuous Wave Plasma Etch
A Vatsal, S Oehler, M Rudolph, V Brackmann, JW Bartha
Electrochemical Society Meeting Abstracts prime2020, 1385-1385, 2020
2020
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