István Mohácsi
István Mohácsi
European XFEL
Verified email at xfel.eu
Title
Cited by
Cited by
Year
Interlaced zone plate optics for hard X-ray imaging in the 10 nm range
I Mohacsi, I Vartiainen, B Rösner, M Guizar-Sicairos, VA Guzenko, ...
Scientific reports 7, 43624, 2017
642017
High-efficiency zone-plate optics for multi-keV X-ray focusing
I Mohacsi, P Karvinen, I Vartiainen, VA Guzenko, A Somogyi, CM Kewish, ...
Journal of synchrotron radiation 21 (3), 497-501, 2014
332014
High resolution double-sided diffractive optics for hard X-ray microscopy
I Mohacsi, I Vartiainen, M Guizar-Sicairos, P Karvinen, VA Guzenko, ...
Optics express 23 (2), 776-786, 2015
292015
Following the dynamics of matter with femtosecond precision using the X-ray streaking method
C David, P Karvinen, M Sikorski, S Song, I Vartiainen, CJ Milne, ...
Scientific reports 5, 7644, 2015
262015
RESCAN: an actinic lensless microscope for defect inspection of EUV reticles
I Mochi, P Helfenstein, I Mohacsi, R Rajendran, D Kazazis, S Yoshitake, ...
Journal of Micro/Nanolithography, MEMS, and MOEMS 16 (4), 041003, 2017
242017
Scanning coherent diffractive imaging methods for actinic extreme ultraviolet mask metrology
P Helfenstein, I Mohacsi, R Rajeev, Y Ekinci
Journal of Micro/Nanolithography, MEMS, and MOEMS 15 (3), 034006, 2016
202016
1 kHz fixed-target serial crystallography using a multilayer monochromator and an integrating pixel detector
A Tolstikova, M Levantino, O Yefanov, V Hennicke, P Fischer, J Meyer, ...
IUCrJ 6 (5), 2019
182019
Towards a stand-alone high throughput EUV actinic photomask inspection tool - RESCAN
R Rajeev, I Mochi, P Helfenstein, I Mohacsi, S Redford, A Mozzanica, ...
16*2017
Towards a stand-alone high-throughput EUV actinic photomask inspection tool: RESCAN
R Rajendran, I Mochi, P Helfenstein, I Mohacsi, S Redford, A Mozzanica, ...
Metrology, Inspection, and Process Control for Microlithography XXXI 10145 …, 2017
162017
Multilayer Laue lenses at high X-ray energies: performance and applications
KT Murray, AF Pedersen, I Mohacsi, C Detlefs, AJ Morgan, M Prasciolu, ...
Optics express 27 (5), 7120-7138, 2019
142019
Fabrication and characterization of high-efficiency double-sided blazed x-ray optics
I Mohacsi, I Vartiainen, M Guizar-Sicairos, P Karvinen, VA Guzenko, ...
Optics letters 41 (2), 281-284, 2016
142016
Scanning scattering contrast microscopy for actinic EUV mask inspection
I Mohacsi, P Helfenstein, R Rajendran, Y Ekinci
Metrology, Inspection, and Process Control for Microlithography XXX 9778, 97781O, 2016
132016
Influence of finite spatial coherence on ptychographic reconstruction
K Stachnik, I Mohacsi, I Vartiainen, N Stuebe, J Meyer, M Warmer, ...
Applied physics letters 107 (1), 011105, 2015
132015
Demonstration of femtosecond X-ray pump X-ray probe diffraction on protein crystals
NL Opara, I Mohacsi, M Makita, D Castano-Diez, A Diaz, P Juranić, ...
Structural Dynamics 5 (5), 054303, 2018
92018
A robust tool for photon source geometry measurements using the fractional Talbot effect
G Lovric, P Oberta, I Mohacsi, M Stampanoni, R Mokso
Optics express 22 (3), 2745-2760, 2014
82014
Scanning coherent scattering methods for actinic EUV mask inspection
Y Ekinci, P Helfenstein, R Rajeev, I Mochi, I Mohacsi, J Gobrecht, ...
Photomask Technology 2016 9985, 99851P, 2016
72016
Artifact characterization and reduction in scanning X-ray Zernike phase contrast microscopy
I Vartiainen, C Holzner, I Mohacsi, P Karvinen, A Diaz, G Pigino, C David
Optics express 23 (10), 13278-13293, 2015
72015
High efficiency x-ray nanofocusing by the blazed stacking of binary zone plates
I Mohacsi, P Karvinen, I Vartiainen, A Diaz, A Somogyi, CM Kewish, ...
X-Ray Nanoimaging: Instruments and Methods 8851, 88510Z, 2013
52013
Scanning coherent diffractive imaging methods for actinic EUV mask metrology
P Helfenstein, I Mohacsi, R Rajendran, Y Ekinci
Extreme Ultraviolet (EUV) Lithography VII 9776, 97761F, 2016
42016
Femtosecond phase-transition in hard x-ray excited bismuth
M Makita, I Vartiainen, I Mohacsi, C Caleman, A Diaz, HO Jönsson, ...
Scientific reports 9 (1), 602, 2019
32019
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Articles 1–20