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Jie Zhang
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High-performance InAlN/GaN HEMTs on silicon substrate with high fT× Lg
P Cui, A Mercante, G Lin, J Zhang, P Yao, DW Prather, Y Zeng
Applied Physics Express 12 (10), 104001, 2019
482019
InAlN/GaN HEMT on Si with fmax= 270 GHz
P Cui, M Jia, H Chen, G Lin, J Zhang, L Gundlach, JQ Xiao, Y Zeng
IEEE Transactions on Electron Devices 68 (3), 994-999, 2021
362021
Ultrathin InGaO thin film transistors by atomic layer deposition
J Zhang, D Zheng, Z Zhang, A Charnas, Z Lin, DY Peide
IEEE Electron Device Letters 44 (2), 273-276, 2022
312022
extremely thin amorphous indium oxide transistors
A Charnas, Z Zhang, Z Lin, D Zheng, J Zhang, M Si, PD Ye
Advanced Materials 36 (9), 2304044, 2024
232024
First demonstration of BEOL-compatible ultrathin atomiclayer-deposited InZnO transistors with GHz operation and record high bias-stress stability
D Zheng, A Charnas, J Anderson, H Dou, Z Hu, Z Lin, Z Zhang, J Zhang, ...
2022 International Electron Devices Meeting (IEDM), 4.3. 1-4.3. 4, 2022
192022
Impact of ZrO2 Dielectrics Thickness on Electrical Performance of TiO2 Thin Film Transistors with Sub-2 V Operation
J Zhang, M Jia, MG Sales, Y Zhao, G Lin, P Cui, C Santiwipharat, C Ni, ...
ACS Applied Electronic Materials 3 (12), 5483-5495, 2021
192021
High performance anatase-TiO2 thin film transistors with a two-step oxidized TiO2 channel and plasma enhanced atomic layer-deposited ZrO2 gate dielectric
J Zhang, P Cui, G Lin, Y Zhang, MG Sales, M Jia, Z Li, C Goodwin, ...
Applied Physics Express 12 (9), 096502, 2019
192019
Effects of N2O surface treatment on the electrical properties of the InAlN/GaN high electron mobility transistors
P Cui, J Zhang, TY Yang, H Chen, H Zhao, G Lin, L Wei, JQ Xiao, ...
Journal of Physics D: Applied Physics 53 (6), 065103, 2019
172019
Fluorine-passivated In2O3 thin film transistors with improved electrical performance via low-temperature CF4/N2O plasma
J Zhang, A Charnas, Z Lin, D Zheng, Z Zhang, PY Liao, D Zemlyanov, ...
Applied Physics Letters 121 (17), 2022
152022
Sub-60 mV/decade switching via hot electron transfer in nanoscale GaN HEMTs
P Cui, G Lin, J Zhang, Y Zeng
IEEE Electron Device Letters 41 (8), 1185-1188, 2020
142020
InAlN/GaN metal–insulator–semiconductor high-electron-mobility transistor with plasma enhanced atomic layer-deposited ZrO2 as gate dielectric
P Cui, J Zhang, M Jia, G Lin, L Wei, H Zhao, L Gundlach, Y Zeng
Japanese Journal of Applied Physics 59 (2), 020901, 2020
142020
Enhancement-/Depletion-Mode TiO2 Thin-Film Transistors via O2/N2 Preannealing
J Zhang, G Lin, P Cui, M Jia, Z Li, L Gundlach, Y Zeng
IEEE Transactions on Electron Devices 67 (6), 2346-2351, 2020
132020
Back-end-of-line-compatible scaled InGaZnO transistors by atomic layer deposition
J Zhang, Z Lin, Z Zhang, K Xu, H Dou, B Yang, A Charnas, D Zheng, ...
IEEE Transactions on Electron Devices, 2023
122023
Ultrathin-Body TiO2 Thin Film Transistors With Record On-Current Density, ON/OFF Current Ratio, and Subthreshold Swing via O2 Annealing
J Zhang, MG Sales, G Lin, P Cui, P Pepin, JM Vohs, S Mcdonnell, Y Zeng
IEEE Electron Device Letters 40 (9), 1463-1466, 2019
122019
First Demonstration of BEOL-Compatible Atomic-Layer-Deposited InGaZnO TFTs with 1.5 nm Channel Thickness and 60 nm Channel Length Achieving ON/OFF Ratio Exceeding 10 11, SS of …
J Zhang, Z Zhang, Z Lin, K Xu, H Dou, B Yang, X Zhang, H Wang, ...
2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and …, 2023
112023
One-Volt TiO₂ Thin Film Transistors with Low-Temperature Process
J Zhang, Y Zhang, P Cui, G Lin, C Ni, Y Zeng
IEEE Electron Device Letters 42 (4), 521-524, 2021
112021
Performance enhancement of monolayer MoS2 transistors by atomic layer deposition of high-k dielectric assisted by Al2O3 seed layer
G Lin, MQ Zhao, M Jia, J Zhang, P Cui, L Wei, H Zhao, ATC Johnson, ...
Journal of Physics D: Applied Physics 53 (10), 105103, 2019
112019
Reliability of Atomic-Layer-Deposited Gate-All-Around In2O3 Nano-Ribbon Transistors with Ultra-High Drain Currents
Z Zhang, Z Lin, A Charnas, H Dou, Z Shang, J Zhang, M Si, H Wang, ...
2022 International Electron Devices Meeting (IEDM), 30.3. 1-30.3. 4, 2022
102022
Transient Thermal and Electrical Co-Optimization of BEOL Top-Gated ALD In2O3 FETs Toward Monolithic 3-D Integration
PY Liao, D Zheng, S Alajlouni, Z Zhang, M Si, J Zhang, JY Lin, ...
IEEE Transactions on Electron Devices 70 (4), 2052-2058, 2023
92023
The effect of negative substrate bias on the electrical characteristics of InAlN/GaN MIS-HEMTs
P Cui, L Wei, G Lin, J Zhang, H Zhao, Y Zeng
Journal of Physics D: Applied Physics 52 (46), 465104, 2019
92019
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