| Extraction and modeling of self-heating and mutual thermal coupling impedance of bipolar transistors N Nenadovic, S Mijalkovic, LK Nanver, LKJ Vandamme, V d'Alessandro, ... IEEE Journal of Solid-State Circuits 39 (10), 1764-1772, 2004 | 79 | 2004 |
| A back-wafer contacted silicon-on-glass integrated bipolar process. Part II. A novel analysis of thermal breakdown N Nenadovic, V d'Alessandro, LK Nanver, F Tamigi, N Rinaldi, ... IEEE Transactions on Electron Devices 51 (1), 51-62, 2004 | 76 | 2004 |
| A back-wafer contacted silicon-on-glass integrated bipolar process. Part I. The conflict electrical versus thermal isolation LK Nanver, N Nenadovic, V d'Alessandro, H Schellevis, HW Van Zeijl, ... IEEE Transactions on Electron Devices 51 (1), 42-50, 2004 | 75 | 2004 |
| Linking insulator-to-metal transitions at zero and finite magnetic fields Y Hanein, N Nenadovic, D Shahar, H Shtrikman, J Yoon, CC Li, DC Tsui Nature 400 (6746), 735-737, 1999 | 68 | 1999 |
| Restabilizing mechanisms after the onset of thermal instability in bipolar transistors N Nenadovic, V d'Alessandro, L La Spina, N Rinaldi, LK Nanver IEEE transactions on electron devices 53 (4), 643-653, 2006 | 35 | 2006 |
| RF power silicon-on-glass VDMOSFETs N Nenadovic, V Cuoco, SJCH Theeuwen, H Schellevis, G Spierings, ... IEEE Electron Device Letters 25 (6), 424-426, 2004 | 29 | 2004 |
| Electrothermal limitations on the current density of high-frequency bipolar transistors N Nenadovic, LK Nanver, JW Slotboom IEEE transactions on electron devices 51 (12), 2175-2180, 2004 | 28 | 2004 |
| Bulk-micromachined test structure for fast and reliable determination of the lateral thermal conductivity of thin films L La Spina, AW van Herwaarden, H Schellevis, WHA Wien, N Nenadovic, ... IEEE/ASME Journal of Microelectromechanical Systems 16 (3), 675-683, 2007 | 24 | 2007 |
| PVD Aluminium Nitride as Heat Spreader in SilicononGlass Technology L La Spina, H Schellevis, N Nenadovic, LK Nanver 2006 25th International Conference on Microelectronics, 338-341, 2006 | 18 | 2006 |
| Analytical formulation and electrical measurements of self-heating in silicon BJT's N Nenadovic, V d'Alessandro, LK Nanver, N Rinaldi, H Schellevis, ... Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting, 24-27, 2002 | 16 | 2002 |
| MEMS test structure for measuring thermal conductivity of thin films L La Spina, N Nenadovic, AW Van Herwaarden, H Schellevis, WHA Wien, ... 2006 IEEE International Conference on Microelectronic Test Structures, 137-142, 2006 | 15 | 2006 |
| Gain and threshold-current calculation of V-groove quantum-wire InGaAs-InP laser DM Gvozdic, NM Nenadovic, A Schlachetzki IEEE journal of quantum electronics 38 (12), 1565-1579, 2002 | 14 | 2002 |
| Thermal instability in two-finger bipolar transistors N Nenadovic, V d'Alessandro, F Tamigi, A Rossi, A Griffo, LK Nanver, ... ESSDERC'03. 33rd Conference on European Solid-State Device Research, 2003 …, 2003 | 13 | 2003 |
| Thermally induced current bifurcation in bipolar transistors L La Spina, N Nenadović, V d’Alessandro, F Tamigi, N Rinaldi, LK Nanver, ... Solid-state electronics 50 (5), 877-888, 2006 | 12 | 2006 |
| Offset voltage of Schottky-collector silicon-on-glass vertical PNP's G Lorito, LK Nanver, N Nenadovic Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting, 2005., 22-25, 2005 | 11 | 2005 |
| High-performance Silicon-On-Glass VDMOS transistor for RF-power applications N Nenadovic, V Cuoco, S Theeuwen, LK Nanver, HFF Jos, JW Slotboom Proc. ESSDERCÕ02, 379-82, 2002 | 10 | 2002 |
| Thermal issues in a backwafer contacted silicon-on-glass integrated bipolar process N Nenadovic, LK Nanver, H Schellevis, HW Van Zeijl, JW Slotboom 2001 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems …, 2001 | 9 | 2001 |
| FEAT-A simulation tool for electrothermal analysis of multifinger bipolar transistors L La Spina, N Nenadovic, V d'Alessandro, LK Nanver, N Rinaldi EUROCON 2005-The International Conference on" Computer as a Tool" 1, 879-882, 2005 | 8 | 2005 |
| The electro-thermal smoothie database model for LDMOS devices V Cuoco, WCE Neo, M Spirito, O Yanson, N Nenadovic, LCN de Vreede, ... Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat …, 2004 | 8 | 2004 |
| A novel SPICE macromodel of BJTs including the temperature dependence of high-injection effects V d'Alessandro, N Nenadovic, F Tamigi, N Rinaldi, LK Nanver, ... 2004 24th International Conference on Microelectronics (IEEE Cat. No …, 2004 | 8 | 2004 |
