Ivan Davoli
Ivan Davoli
Full Professor of Experimental Physics, University of Rome "Tor Vergata"
Verified email at uniroma2.it
TitleCited byYear
Multiple-scattering regime and higher-order correlations in x-ray-absorption spectra of liquid solutions
M Benfatto, CR Natoli, A Bianconi, J Garcia, A Marcelli, M Fanfoni, I Davoli
Physical Review B 34 (8), 5774, 1986
2261986
Giant Raman scattering and luminescence by molecules adsorbed on Ag and Au metal island films
CY Chen, I Davoli, G Ritchie, E Burstein
Surface Science 101, 363-366, 1980
1001980
Multielectron configurations in the x-ray-absorption near-edge structure of NiO at the oxygen K threshold
I Davoli, A Marcelli, A Bianconi, M Tomellini, M Fanfoni
Physical Review B 33 (4), 2979, 1986
911986
GILDA (Italian beamline) on BM8
F D’Acapito, S Colonna, S Pascarelli, G Antonioli, A Balerna, A Bazzini, ...
ESRF Newsletter 30 (42), 22, 1998
821998
Optimization of a NOx gas sensor based on single walled carbon nanotubes
M Lucci, A Reale, A Di Carlo, S Orlanducci, E Tamburri, ML Terranova, ...
Sensors and actuators B: Chemical 118 (1-2), 226-231, 2006
782006
Structural surface investigations with low-energy backscattered electrons
M De Crescenzi
Surface science reports 21 (3-4), 89-175, 1995
631995
X-ray absorption and photoelectron spectroscopy studies on graphite and single-walled carbon nanotubes: oxygen effect
M Abbas, ZY Wu, J Zhong, K Ibrahim, A Fiori, S Orlanducci, V Sessa, ...
Applied Physics Letters 87 (5), 051923, 2005
562005
The valence and speciation of sulfur in glasses by X-ray absorption spectroscopy
E Paris, G Giuli, MR Carroll, I Davoli
The Canadian Mineralogist 39 (2), 331-339, 2001
542001
Structure of densified vitreous silica: silicon and oxygen XANES spectra and multiple scattering calculations
I Davoli, E Paris, S Stizza, M Benfatto, M Fanfoni, A Gargano, A Bianconi, ...
Physics and Chemistry of Minerals 19 (3), 171-175, 1992
521992
The ReflEXAFS station at the GILDA beamline (BM08) of ESRF
F D'Acapito, I Davoli, P Ghigna, S Mobilio
Journal of synchrotron radiation 10 (3), 260-264, 2003
512003
Indentation modulus and hardness of viscoelastic thin films by atomic force microscopy: A case study
D Passeri, A Bettucci, A Biagioni, M Rossi, A Alippi, E Tamburri, M Lucci, ...
Ultramicroscopy 109 (12), 1417-1427, 2009
452009
X-ray photoelectron-diffraction study of intermixing and morphology at the Ge/Si (001) and Ge/Sb/Si (001) interface
R Gunnella, P Castrucci, N Pinto, I Davoli, D Sébilleau, M De Crescenzi
Physical Review B 54 (12), 8882, 1996
441996
Three particle correlation function of metal ions in tetrahedral coordination determined by XANES
J Garcia, M Benfatto, CR Natoli, A Bianconi, I Davoli, A Marcelli
Solid state communications 58 (9), 595-599, 1986
441986
Theoretical analysis of x-ray-absorption spectra at the silicon K and L 2, 3 edges of crystalline and amorphous SiO 2
J Chaboy, M Benfatto, I Davoli
Physical Review B 52 (14), 10014, 1995
391995
Electrochemical behavior of glass melts
K Takahashi, Y Miura
Journal of Non-Crystalline Solids 95, 119-130, 1987
381987
Probing higher order correlation functions in liquids by XANES (X-ray absorption Near Edge Structure)
A Bianconi, J Garcia, A Marcelli, M Benfatto, CR Natoli, I Davoli
Le Journal de Physique Colloques 46 (C9), C9-101-C9-106, 1985
371985
Experimental evidence for the “shake-down” peak in LIII (and LII)-xanes of light rare earth intermetallics
A Bianconi, A Marcelli, I Davoli, S Stizza, M Campagna
Solid state communications 49 (5), 409-415, 1984
371984
Determination of mixing of 4f-ligand orbitals in Ce (SO4) 2 by Xanes is Ce (SO4) 2 a mixed valent insulating system?
A Bianconi, A Marcelli, M Tomellini, I Davoli
Journal of Magnetism and Magnetic Materials 47, 209-211, 1985
351985
Atomic force acoustic microscopy characterization of nanostructured selenium–tin thin films
D Passeri, M Rossi, A Alippi, A Bettucci, D Manno, A Serra, E Filippo, ...
Superlattices and Microstructures 44 (4-5), 641-649, 2008
332008
Quantitative measurement of indentation hardness and modulus of compliant materials by atomic force microscopy
D Passeri, A Bettucci, A Biagioni, M Rossi, A Alippi, M Lucci, I Davoli, ...
Review of scientific instruments 79 (6), 066105, 2008
312008
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