TaeDong Kang

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Coauteurs

HOSUN LEEKyung Hee UniversityAdresse e-mail validée de khu.ac.kr
Hadis MorkoçVirginia Commonwealth UniversityAdresse e-mail validée de vcu.edu
Andrei SirenkoDepartment of Physics, New Jersey Institute of TechnologyAdresse e-mail validée de njit.edu
Bo XiaoAdresse e-mail validée de perml.com
Sang-Wook CheongProfessor of Physics, Rutgers UniversityAdresse e-mail validée de physics.rutgers.edu
Changhee SohnUlsan National Institute of Science and Technology (UNIST)Adresse e-mail validée de unist.ac.kr
Vitaliy AvrutinVirginia Commonwealth UniversityAdresse e-mail validée de vcu.edu
Michael KotelyanskiiSenior Member of Technical Staff, Onto Innovation, Visiting Research Professor, NJITAdresse e-mail validée de ontoinnovation.com
Jun-Woo ParkKyungHee UniversityAdresse e-mail validée de khu.ac.kr
Umit OzgurVirginia Commonwealth UniversityAdresse e-mail validée de vcu.edu
Soonyong ParkChung-Ang UniversityAdresse e-mail validée de cau.ac.kr
Minu KimChung-Ang UniversityAdresse e-mail validée de cau.ac.kr
Suhuai WeiEastern Institute of Technology, Ningbo, ChinaAdresse e-mail validée de eitech.edu.cn
G. Lawrence CarrSenior Physicist, Brookhaven National LaboratoryAdresse e-mail validée de bnl.gov
Dr. Amit KhareTrinity College DublinAdresse e-mail validée de tcd.ie
Jungseek HwangProfessor of Physics, Sungkyunkwan University, Republic of KoreaAdresse e-mail validée de skku.edu
Jaejun YuProfessor of Physics and Astronomy, Seoul National UniversityAdresse e-mail validée de snu.ac.kr
Young Jai ChoiYonsei UniversityAdresse e-mail validée de yonsei.ac.kr
Deok-Yong ChoJeonbuk National UniversityAdresse e-mail validée de jbnu.ac.kr
DONG HOON CHOIProfessor of Chemistry, Korea UniversityAdresse e-mail validée de korea.ac.kr

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TaeDong Kang

Autres noms강태동, T. D. Kang, Tae Dong Kang

Nova Measuring Instruments

Adresse e-mail validée de novami.com

Optical Metrology OCD Ellipsometry Optical Spectroscopy Data Analytics


Titre Trier par citations Trier par année Trier par titre	Citée par Citée par	Année
Topotactic Metal–Insulator Transition in Epitaxial SrFeO_x Thin Films A Khare, D Shin, TS Yoo, M Kim, TD Kang, J Lee, S Roh, IH Jung, ... Advanced Materials 29 (37), 1606566, 2017	130	2017
Optical properties of (GeTe, Sb2Te3) pseudobinary thin films studied with spectroscopic ellipsometry JW Park, SH Baek, TD Kang, H Lee, YS Kang, TY Lee, DS Suh, KJ Kim, ... Applied Physics Letters 93 (2), 2008	82	2008
Dielectric functions and electronic band structure of lead zirconate titanate thin films H Lee, YS Kang, SJ Cho, B Xiao, H Morkoç, TD Kang, GS Lee, J Li, ... Journal of applied physics 98 (9), 2005	79	2005
Mixing between and orbitals in NaIrO: A spectroscopic and density functional calculation study CH Sohn, HS Kim, TF Qi, DW Jeong, HJ Park, HK Yoo, HH Kim, JY Kim, ... Physical Review B—Condensed Matter and Materials Physics 88 (8), 085125, 2013	70	2013
Effect of Ga∕ In ratio on the optical and electrical properties of GaInZnO thin films grown on SiO2∕ Si substrates D Kang, I Song, C Kim, Y Park, TD Kang, HS Lee, JW Park, SH Baek, ... Applied Physics Letters 91 (9), 2007	62	2007
Microcrystalline silicon thin films studied using spectroscopic ellipsometry TD Kang, H Lee, SJ Park, J Jang, S Lee Journal of Applied Physics 92 (5), 2467-2474, 2002	58	2002
Optical properties of black NiO and CoO single crystals studied with spectroscopic ellipsometry TD Kang, HS Lee, H Lee Journal of the Korean Physical Society 50 (3), 632-637, 2007	51	2007
Temperature Evolution of Itinerant Ferromagnetism in Probed by Optical Spectroscopy DW Jeong, HC Choi, CH Kim, SH Chang, CH Sohn, HJ Park, TD Kang, ... Physical Review Letters 110 (24), 247202, 2013	46	2013
Synchrotron radiation-based far-infrared spectroscopic ellipsometer with full Mueller-matrix capability TN Stanislavchuk, TD Kang, PD Rogers, EC Standard, R Basistyy, ... Review of Scientific Instruments 84 (2), 2013	42	2013
Coupling between magnon and ligand-field excitations in magnetoelectric garnet TD Kang, E Standard, KH Ahn, AA Sirenko, GL Carr, S Park, YJ Choi, ... Physical Review B—Condensed Matter and Materials Physics 82 (1), 014414, 2010	40	2010
Suppression of three-dimensional charge density wave ordering via thickness control G Kim, M Neumann, M Kim, MD Le, TD Kang, TW Noh Physical Review Letters 115 (22), 226402, 2015	35	2015
Large electro-optic effect in single-crystal Pb (Zr, Ti) O3 (001) measured by spectroscopic ellipsometry TD Kang, B Xiao, V Avrutin, Ü Özgür, H Morkoç, JW Park, HS Lee, H Lee, ... Journal of Applied Physics 104 (9), 2008	28	2008
Adjusted oscillator strength matching for hybrid magnetic and electric excitations in DyFeO garnet PD Rogers, YJ Choi, EC Standard, TD Kang, KH Ahn, A Dubroka, ... Physical Review B—Condensed Matter and Materials Physics 83 (17), 174407, 2011	26	2011
High quality epitaxial growth of PbTiO3 by molecular beam epitaxy using H2O2 as the oxygen source X Gu, N Izyumskaya, V Avrutin, H Morkoç, TD Kang, H Lee Applied physics letters 89 (12), 2006	22	2006
Visible-ultraviolet spectroscopic ellipsometry of lead zirconate titanate thin films H Lee, YS Kang, SJ Cho, B Xiao, H Morkoç, TD Kang Applied Physics Letters 86 (26), 2005	22	2005
Far-infrared spectra of the magnetic exchange resonances and optical phonons and their connection to magnetic and dielectric properties of DyFeO garnet TD Kang, EC Standard, PD Rogers, KH Ahn, AA Sirenko, A Dubroka, ... Physical Review B—Condensed Matter and Materials Physics 86 (14), 144112, 2012	21	2012
Mueller matrices for anisotropic metamaterials generated using 4× 4 matrix formalism PD Rogers, TD Kang, T Zhou, M Kotelyanskii, AA Sirenko Thin Solid Films 519 (9), 2668-2673, 2011	21	2011
Ellipsometry on uniaxial ZnO and Zn1− xMgxO thin films grown on (0001) sapphire substrate TD Kang, H Lee, WI Park, GC Yi Thin Solid Films 455, 609-614, 2004	19	2004
Optical spectroscopy of the carrier dynamics in LaVO/SrVO superlattices DW Jeong, WS Choi, TD Kang, CH Sohn, A David, H Rotella, AA Sirenko, ... Physical Review B—Condensed Matter and Materials Physics 84 (11), 115132, 2011	18	2011
Optical properties of SiO2/nanocrystalline Si multilayers studied using spectroscopic ellipsometry KJ Lee, TD Kang, H Lee, SH Hong, SH Choi, TY Seong, KJ Kim, ... Thin Solid Films 476 (1), 196-200, 2005	18	2005

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