Andrea Lucibello
Andrea Lucibello
National Research Council - Institute of Microelectronics and Microsystems (CNR-IMM)
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Quantitative sub-surface and non-contact imaging using scanning microwave microscopy
G Gramse, E Brinciotti, A Lucibello, SB Patil, M Kasper, C Rankl, ...
Nanotechnology 26 (13), 135701, 2015
Mechanical modelling of capacitive RF MEMS shunt switches
R Marcelli, A Lucibello, G De Angelis, E Proietti, D Comastri
Microsystem technologies 16 (7), 1057-1064, 2010
Advanced Microwave and Millimeter Wave Technologies: Semiconductor Devices Circuits and Systems
M Mukherjee
BoD–Books on Demand, 2010
Reliability of RF MEMS switches due to charging effects and their circuital modelling
R Marcelli, G Bartolucci, G Papaioannu, G De Angelis, A Lucibello, ...
Microsystem technologies 16 (7), 1111-1118, 2010
Influence of design and fabrication on RF performance of capacitive RF MEMS switches
A Persano, F Quaranta, G Capoccia, E Proietti, A Lucibello, R Marcelli, ...
Microsystem Technologies 22 (7), 1741-1746, 2016
Analysis of a transmission mode scanning microwave microscope for subsurface imaging at the nanoscale
AO Oladipo, A Lucibello, M Kasper, S Lavdas, GM Sardi, E Proietti, ...
Applied Physics Letters 105 (13), 133112, 2014
Reliability of RF MEMS capacitive and ohmic switches for space redundancy configurations
A Lucibello, R Marcelli, E Proietti, G Bartolucci, V Mulloni, B Margesin
Microsystem Technologies 21 (9), 1903-1913, 2015
Dielectric charging in microwave microelectromechanical Ohmic series and capacitive shunt switches
R Marcelli, G Papaioannu, S Catoni, G De Angelis, A Lucibello, E Proietti, ...
Journal of Applied Physics 105 (11), 114514, 2009
Cycling reliability of RF-MEMS switches with Gold–Platinum multilayers as contact material
V Mulloni, B Margesin, P Farinelli, R Marcelli, A Lucibello, G De Angelis
Microsystem Technologies 23 (9), 3843-3850, 2017
Analytic modeling of RF MEMS shunt connected capacitive switches
G Bartolucci, GD Angelis, A Lucibello, R Marcelli, E Proietti
Journal of Electromagnetic Waves and Applications 26 (8-9), 1168-1179, 2012
RF MEMS switches fabrication by using SU-8 technology
A Lucibello, E Proietti, F Giacomozzi, R Marcelli, G Bartolucci, ...
Microsystem technologies 19 (6), 929-936, 2013
Reliable response of RF MEMS LTCC packaged switches after mechanical and thermal stress
A Lucibello, G Capoccia, E Proietti, R Marcelli, B Margesin, V Mulloni, ...
Microsystem Technologies 22 (3), 495-501, 2016
Variability of the drain current in junctionless nanotransistors induced by random dopant fluctuation
G Giusi, A Lucibello
IEEE Transactions on Electron Devices 61 (3), 702-706, 2014
Composite Right/Left Handed (CRLH) based devices for microwave applications
S Simion, R Marcelli, G Bartolucci, F Craciunoiu, A Lucibello, ...
Advanced Microwave and Millimeter Wave Technologies: Semiconductor Devices…, 2010
Scanning microwave microscopy technique for nanoscale characterization of magnetic materials
CH Joseph, GM Sardi, SS Tuca, G Gramse, A Lucibello, E Proietti, ...
Journal of Magnetism and Magnetic Materials 420, 62-69, 2016
Compact 12 12 switch matrix integrating RF MEMS switches in LTCC hermetic packages
F Diaferia, F Deborgies, S Di Nardo, B Espana, P Farinelli, A Lucibello, ...
2014 44th European Microwave Conference, 199-202, 2014
RF MEMS ohmic switches for matrix configurations
G De Angelis, A Lucibello, E Proietti, R Marcelli, G Bartolucci, F Casini, ...
International Journal of Microwave and Wireless Technologies 4 (4), 421-433, 2012
Wafer-level micropackaging in thin film technology for RF MEMS applications
A Persano, P Siciliano, F Quaranta, A Taurino, A Lucibello, R Marcelli, ...
Microsystem Technologies 24 (1), 575-585, 2018
Optimization of the imaging response of scanning microwave microscopy measurements
GM Sardi, A Lucibello, M Kasper, G Gramse, E Proietti, F Kienberger, ...
Applied Physics Letters 107 (3), 033107, 2015
A broadband toolbox for scanning microwave microscopy transmission measurements
A Lucibello, GM Sardi, G Capoccia, E Proietti, R Marcelli, M Kasper, ...
Review of Scientific Instruments 87 (5), 053701, 2016
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